Inverted Microscope Upgrade
Integration of SECM with inverted optical microscopy for simultaneous electrochemical measurements and high-quality imaging of biointerfaces, live cells, and microstructured samples.
SECM Integration with Inverted Optical Microscopy
The Inverted Microscope Upgrade enables the integration of Sensolytics SECM positioning system with inverted optical microscopes (e.g., Zeiss Axiovert 5, Leica DMi 8), allowing simultaneous electrochemical measurements and high-quality optical monitoring of transparent substrates. This configuration is particularly relevant for the investigation of biointerfaces, live cells, biofilms, and microfabricated structures.
The upgrade includes adapting plates that allow the SECM positioning system to be mounted reversibly either on the inverted microscope or on the standard SECM base plate. This configuration allows a flexible switch between the microscope-integrated operating mode and the stand-alone SECM. A special electrode holder is provided to adjust the horizontal offset between the SECM positioning system and the optical pathway of the microscope to maintain a free imaging path through the microscope.
The inverted microscope upgrade is designed for integration with a range of inverted microscope platforms, with standard configurations for Zeiss Axiovert 5 and Leica DMi8 . We can assess compatibility with other brands of microscopes, including legacy and out-of-production models. Please contact us to discuss your specific setup.
This upgrade can be implemented at any time and remains fully compatible with additional modules such as the option High-Res or shearforce-based distance control, enabling future upgrades to more advanced SECM configurations.
The performance of the integrated system is defined by the selected SECM configuration and the microscope setup.
Detailed specifications of the microscope platforms can be found here:
Sensolytics Base SECM
The complete scanning electrochemical microscopy (SECM) system providing high-resolution XYZ positioning, and intuitive software control for spatially resolved electrochemical measurements.
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Option High-Res
Upgrade to a closed-loop piezoelectric positioning system for nanometer-scale imaging. The module provides 1.5 nm nominal resolution and 0.2 nm repeatability, using Silicon HR sensor for position feedback and enables software-based tilt correction.
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Option Shearforce
Option for integrating shearforce-based constant-distance mode imaging for a deconvolution of topographic and electrochemical activity signals, supporting measurements on rough surfaces and substrates with structural features below 1 µm.
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Ultramicroelectrodes
Ultramicroelectrodes made of different electrode materials enable high spatial resolution and fast steady-state currents, minimizing capacitive contributions and supporting quantitative analysis of localized kinetics and mass transport processes.
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Nanoelectrodes
Nanoelectrodes enable electrochemical measurements at the nanometer scale with minimal perturbation, allowing the investigation of confined regions and highly localized electrochemical activity.
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SECCM & SICM Probes
Glass micro- and nanopipettes for scanning ion conductance microscopy (SICM) and scanning electrochemical cell microscopy (SECCM), enabling confined electrochemical measurements at the sub-micrometer spatial resolution.
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Polarization Cells
These electrochemical cells enable controlled sample polarization from the top or bottom and support the operation with macroelectrodes serving as substrates.
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Specialized Cells
Our range of specialized SECM cells is tailored for application-specific experiments, including complete measuring cells optimized for screen-printed electrodes, temperature-controlled studies, and flow or gas-controlled experiments.
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Standard Cells
Start with a complete electrochemical cell setup, including a baseplate for manual tilt correction, distance plates, and cells with integrated inlets for reference and counter electrodes. Available in standard PMMA or highly chemically resistant PEEK.
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Auxiliary Electrodes
Explore a complete portfolio of miniaturized reference and counter electrodes for reliable electrochemical measurements. From aqueous and gel-based Ag/AgCl references to mini hydrogen electrodes, Pt nets, and compact Pt coil counter electrodes.
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Faraday Cages
Built from robust varnished steel and optimized for Sensolytics SECM and SDC systems, our Faraday Cages are designed to ensure low-noise measurement conditions for high-sensitivity electrochemical experiments, maintaining convenient access for cables and instrumentation.
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Measuring Station
Built for high-precision electrochemical applications, the Measuring Station minimizes the influence of external vibrations through passive isolation and a dedicated granite slab integration.
Explore →Not sure which SECM configuration fits your experiment?
Contact us to discuss your application, experimental conditions, and configuration requirements. We support system selection and customization based on your individual requirements and future upgrades.
Frequently Asked Questions
Standard configurations are available for Zeiss Axiovert 5 and Leica DMi8 platforms. The integration with other inverted microscopes is generally possible but depends on the stage geometry as well as the distance and access to the optical axis. Contact us to evaluate the compatibility for your specific microscope model.
Yes. The SECM positioning system can be removed and mounted on the standard SECM base plate. The integration is fully reversible and does not require permanent modification, allowing flexible switching between microscope-integrated and stand-alone modes.
No. Electrochemical performance and spatial resolution are determined by the SECM configuration, including probe size, positioning system, and measurement mode.
The microscope integration provides optical access but does not alter the intrinsic measurement characteristics of the SECM system.
To integrate the SECM hardware, the condenser arm of the optical microscope is removed as part of the Inverted Optical Microscope Upgrade. This modification does not compromise SECM performance or positioning accuracy. The optical microscope remains available for high-quality sample observation, alignment, and positioning, while transmitted-light imaging via the condenser is not possible during SECM operations. In the combined setup, an additional external light source, such as a gooseneck lamp, illuminates the sample.
No. Optical probe approach supports coarse positioning, observation of the sample surface during SECM scans with high optical resolution, and the targeting of the region of interest but does not provide quantitative control of the tip-sample separation. The accurate control of the tip-sample separation in SECM relies on electrochemical feedback (e.g., approach curves in feedback mode) or shearforce-based methods, which define the probe position relative to the surface with micrometer to nanometer precision.
